Agilent WaferPro Express 2016.04 HF1

Agilent WaferPro Express 2016.04 HF1
WaferPro Express is a key compo
–
nent of Agilent Technologies and
Cascade Microtech Wafer-level
Measurement Solutions (WMS).
These system solutions are pre-
validated to minimize the time to
first measurement and provide
accurate and repeatable device
and component characterization.
WMS delivers guaranteed system
configuration, installation and sup
–
port (Figure 1).
•
The modern and simple to use
interface reduces time to first
measurement on newly assembled
measurement systems and simpli
–
fies the everyday procedure of set
–
ting up automated measurement
2
Features At A Glance
•
Large library of tests and instrument configurations available for most com
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mon semiconductor devices. Standard S-parameters, DC-IV/CV, noise figure,
1/f noise, and gain compression measurements can be set up and executed
very quickly.
•
Highly optimized for Cascade Microtech wafer probers, the software effi
–
ciently supports other prober manufacturers as well.
•
The Python programming environment allows users to design and implement
custom tests and data post-processing. Measured data can be conveniently
saved to ASCII files or to SQL database format, which greatly improves secu
–
rity and allows users to quickly search data.
•
The comprehensive support for a variety of instruments, probers, and thermal
matricies allows lab managers to optimize lab equipment. WaferPro Express
is a unified software test measurement environment, and a WaferPro test
project is independent of instrument firmware and dedicated instrument
software.
•
Fully integrated in the Agilent device modeling flow. Data can easily be
exported to modeling platforms such as Agilent IC-CAP, Agilent MBP and
Agilent MQA.
•
Highly efficient drivers for the most common Agilent instruments, such as
DC analyzers and the PNA Series of network analyzers, CV meters and power
supplies.
Product:Agilent WaferPro Express 2016.04 HF1
Lanaguage:english
Platform:Win7/WIN8
Size:1DVD